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Ophthalmology Anatomy, Development and clinical examination 424d050d

The Imbe-Fick law is associated with

A
Schiotz tonometry
B
Applanation tonometry
C
Pachymetry
D
Keratometry
High-Yield Explanation
The concept of applanation tonometry was introduced by Goldmann is 1954. It is based on Imbe- Fick law which states that the pressure inside a sphere (P) is equal to the force (W) required flattening its surface divided by the area of flattening (A); i.e., P = W/A. Reference: AK khurana 7th edition

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